Feature-based Classification for Image Segmentation in Automotive Radar Based on Statistical Distribution Analysis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Segmentation and potential classification of surface and obstacle regions in automotive radar imagery is the key enabler of effective path planning in autonomous driving. As opposed to traditional radar processing where clutter is considered as an unwanted return and should be effectively removed, autonomous driving requires full scene assessment, where clutter carries necessary information for situational awareness of the autonomous platform and needs to be fully assessed to find the passable areas. In this paper, the statistical distribution features of the radar intensity data of several road-related scenes including asphalt, grass, shadow and target object areas are investigated. The algorithm of classification is developed based on distribution feature extraction and a multivariate Gaussian distribution (MGD) model. Under test dataset recorded by multi-sensor suit was used to evaluate the confusion matrix and F1 score of this classification algorithm.

Original languageEnglish
Title of host publication2020 IEEE Radar Conference, RadarConf 2020
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
ISBN (Electronic)9781728189420
DOIs
Publication statusPublished - 21 Sept 2020
Event2020 IEEE Radar Conference, RadarConf 2020 - Florence, Italy
Duration: 21 Sept 202025 Sept 2020

Publication series

NameIEEE National Radar Conference - Proceedings
Volume2020-September
ISSN (Print)1097-5659

Conference

Conference2020 IEEE Radar Conference, RadarConf 2020
Country/TerritoryItaly
CityFlorence
Period21/09/2025/09/20

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

Keywords

  • Automotive sensor
  • image segmentation
  • multivariate Gaussian distribution
  • radar imaging
  • statistical distribution feature extraction
  • surface classification

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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