Evaluating the reliability of defect-tolerant architectures for nanotechnology with probabilistic model checking

Research output: Contribution to conference (unpublished) › Paper

Original language	English
Pages	907-914
Number of pages	8
Publication status	Published - 1 Jan 2004
Event	Intenational Conference on VLSI Design - Duration: 1 Jan 2004 → …

Conference	Intenational Conference on VLSI Design
Period	1/01/04 → …

Cite this

@conference{5c457cd12e024907b1c46efeb305e9c1,

title = "Evaluating the reliability of defect-tolerant architectures for nanotechnology with probabilistic model checking",

author = "Gethin Norman and David Parker and Marta Kwiatkowska and S Shukla",

year = "2004",

month = jan,

day = "1",

language = "English",

pages = "907--914",

note = "Intenational Conference on VLSI Design ; Conference date: 01-01-2004",

}