Evaluating the reliability of defect-tolerant architectures for nanotechnology with probabilistic model checking

Gethin Norman, David Parker, Marta Kwiatkowska, S Shukla

Research output: Contribution to conference (unpublished)Paper

Original languageEnglish
Number of pages8
Publication statusPublished - 1 Jan 2004
EventIntenational Conference on VLSI Design -
Duration: 1 Jan 2004 → …


ConferenceIntenational Conference on VLSI Design
Period1/01/04 → …

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