Engineering analysis of a failed compass proximal interphalangeal (PIP) joint hinge

M. M. Youssef; D. E.T. Shepherd; O. G. Titley

doi:10.4015/S1016237215500131

Engineering analysis of a failed compass proximal interphalangeal (PIP) joint hinge

M. M. Youssef, D. E.T. Shepherd^*, O. G. Titley

^*Corresponding author for this work

Mechanical Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

A failed compass hinge external fixator for fingers has been analyzed. The device consists of polymer parts manufactured from polyetherimide. Finite element analysis (FEA) was used to investigate the principal stresses in the device under different loading conditions. Scanning electron microscopy (SEM) was used to investigate the fracture surfaces. The FEA showed that the maximum principal stress was greater than the fatigue strength of polyetherimide. The SEM fractographs confirm that failure was by brittle fatigue.

Original language	English
Article number	1550013
Journal	Biomedical Engineering - Applications, Basis and Communications
Volume	27
Issue number	2
DOIs	https://doi.org/10.4015/S1016237215500131
Publication status	Published - 25 Apr 2015

Bibliographical note

Publisher Copyright:
© 2015 National Taiwan University.

Keywords

Compass hinge
Fatigue
Finite element analysis
Fracture
Scanning electron microscopy

ASJC Scopus subject areas

Biophysics
Bioengineering
Biomedical Engineering

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10.4015/S1016237215500131

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title = "Engineering analysis of a failed compass proximal interphalangeal (PIP) joint hinge",

abstract = "A failed compass hinge external fixator for fingers has been analyzed. The device consists of polymer parts manufactured from polyetherimide. Finite element analysis (FEA) was used to investigate the principal stresses in the device under different loading conditions. Scanning electron microscopy (SEM) was used to investigate the fracture surfaces. The FEA showed that the maximum principal stress was greater than the fatigue strength of polyetherimide. The SEM fractographs confirm that failure was by brittle fatigue.",

keywords = "Compass hinge, Fatigue, Finite element analysis, Fracture, Scanning electron microscopy",

author = "Youssef, \{M. M.\} and Shepherd, \{D. E.T.\} and Titley, \{O. G.\}",

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AU - Titley, O. G.

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Y1 - 2015/4/25

N2 - A failed compass hinge external fixator for fingers has been analyzed. The device consists of polymer parts manufactured from polyetherimide. Finite element analysis (FEA) was used to investigate the principal stresses in the device under different loading conditions. Scanning electron microscopy (SEM) was used to investigate the fracture surfaces. The FEA showed that the maximum principal stress was greater than the fatigue strength of polyetherimide. The SEM fractographs confirm that failure was by brittle fatigue.

AB - A failed compass hinge external fixator for fingers has been analyzed. The device consists of polymer parts manufactured from polyetherimide. Finite element analysis (FEA) was used to investigate the principal stresses in the device under different loading conditions. Scanning electron microscopy (SEM) was used to investigate the fracture surfaces. The FEA showed that the maximum principal stress was greater than the fatigue strength of polyetherimide. The SEM fractographs confirm that failure was by brittle fatigue.

KW - Compass hinge

KW - Fatigue

KW - Finite element analysis

KW - Fracture

KW - Scanning electron microscopy

UR - https://www.scopus.com/pages/publications/84928471411

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M3 - Article

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JF - Biomedical Engineering - Applications, Basis and Communications

IS - 2

M1 - 1550013

ER -

Engineering analysis of a failed compass proximal interphalangeal (PIP) joint hinge

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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