Electrospray ion beam deposition: Soft-landing and fragmentation of functional molecules at solid surfaces

Stephan Rauschenbach*, Ralf Vogelgesang, N. Malinowski, Jürgen W. Gerlach, Mohamed Benyoucef, Giovanni Costantini, Zhitao Deng, Nicha Thontasen, Klaus Kern

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

81 Citations (Scopus)

Abstract

The ion beam deposition (IBD) of rhodamine dye molecules on solid surfaces in high vacuum is explored in order to characterize the possibility of fabricating molecular coatings or nanostructures from nonvolatile molecules. Molecular ion beams with a well-defined composition are deposited on silicon oxide surfaces with a controlled kinetic energy. Photoluminescence spectroscopy and time-of-flight secondary ion mass spectrometry (TOF-SIMS) are employed in order to characterize the sample with respect to coverage, homogeneity, and the fraction of intact landed ions (soft-landing ratio). We find that homogeneous rhodamine films of defined composition can be produced at energies of 2-100 eV. The coverage is found to be proportional to the ion dose. Soft-landing is observed for energies up to 35 eV.

Original languageEnglish
Pages (from-to)2901-2910
Number of pages10
JournalACS Nano
Volume3
Issue number10
DOIs
Publication statusPublished - 27 Oct 2009

Keywords

  • Electrospray
  • Fluorescence
  • Fragmentation
  • Ion beam deposition
  • Mass spectrometry
  • Molecular ions
  • Photoluminescence
  • Rhodamine
  • SIMS
  • Soft-landing

ASJC Scopus subject areas

  • General Materials Science
  • General Engineering
  • General Physics and Astronomy

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