Electron channelling contrast imaging of dislocations in a conventional SEM

Bo Pang, Ian Jones, Jeremy C F Millett, Glenn Whiteman, Yu-Lung Chiu

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7 Citations (Scopus)
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Dislocations in shock loaded tantalum single crystals were imaged using both TEM and ECCI in an SEM with a conventional backscattered electron detector. The results were compared with backscattered electron intensity profiles across dislocations calculated via the dynamic theory of electron diffraction. A one-to-one correspondence between ECCI and TEM is established. High voltage and low index reflections should be used to obtain the highest dislocation contrast and greatest imaging depth.
Original languageEnglish
Pages (from-to)346-359
JournalPhilosophical Magazine
Issue number5
Publication statusPublished - 6 Dec 2016


  • Electron microscopy
  • electron channelling
  • dislocations
  • tantalum
  • Computer Simulation
  • crystal defects
  • defect analysis


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