Electro-mechanical durability of pulsed-laser deposited indium tin oxide thin films on polycarbonate substrates for flexible electronic devices

Grzegorz A. Potoczny, J. Stuart Abell, Stephen N. Kukureka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Uniaxial tensile electro-fragmentation tests has shown conductive failure with infinite resistance immediately following the crack onset strain (COS) of high quality 100 nm-thick indium tin oxide (ITO) films pulsed-laser deposited on polycarbonate (PC) flexible substrates. Two possible conductive failure mechanisms of ITO/PC systems are proposed. The results show that the conductive failure immediately following COS is due to poor adhesion between the two components where high elastic mismatch may accelerate the failure mechanism.

Original languageEnglish
Title of host publication31st International Display Research Conference 2011, EuroDisplay 2011
Pages77-80
Number of pages4
Publication statusPublished - 1 Dec 2011
Event31st International Display Research Conference 2011, EuroDisplay 2011 - Arcachon, France
Duration: 19 Sep 201122 Sep 2011

Publication series

NameSID Conference Record of the International Display Research Conference
ISSN (Print)1083-1312

Conference

Conference31st International Display Research Conference 2011, EuroDisplay 2011
Country/TerritoryFrance
CityArcachon
Period19/09/1122/09/11

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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