TY - GEN
T1 - Electro-mechanical durability of pulsed-laser deposited indium tin oxide thin films on polycarbonate substrates for flexible electronic devices
AU - Potoczny, Grzegorz A.
AU - Abell, J. Stuart
AU - Kukureka, Stephen N.
PY - 2011/12/1
Y1 - 2011/12/1
N2 - Uniaxial tensile electro-fragmentation tests has shown conductive failure with infinite resistance immediately following the crack onset strain (COS) of high quality 100 nm-thick indium tin oxide (ITO) films pulsed-laser deposited on polycarbonate (PC) flexible substrates. Two possible conductive failure mechanisms of ITO/PC systems are proposed. The results show that the conductive failure immediately following COS is due to poor adhesion between the two components where high elastic mismatch may accelerate the failure mechanism.
AB - Uniaxial tensile electro-fragmentation tests has shown conductive failure with infinite resistance immediately following the crack onset strain (COS) of high quality 100 nm-thick indium tin oxide (ITO) films pulsed-laser deposited on polycarbonate (PC) flexible substrates. Two possible conductive failure mechanisms of ITO/PC systems are proposed. The results show that the conductive failure immediately following COS is due to poor adhesion between the two components where high elastic mismatch may accelerate the failure mechanism.
UR - http://www.scopus.com/inward/record.url?scp=84860842431&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84860842431
SN - 9781618396006
T3 - SID Conference Record of the International Display Research Conference
SP - 77
EP - 80
BT - 31st International Display Research Conference 2011, EuroDisplay 2011
T2 - 31st International Display Research Conference 2011, EuroDisplay 2011
Y2 - 19 September 2011 through 22 September 2011
ER -