Abstract
We measure, for the first time, the scattering efficiency of resonant terahertz (THz) probes for scattering-type THz near-field microscopy. We fabricate the probes by placing an indium 'antenna' directly on the tine of a quartz tuning fork (QTF), which we use as an atomic force microscope (AFM) probe in tapping mode. THz time-domain spectroscopy (TDS) of the THz field scattered from the probe shows that the scattering efficiency of the indium antenna exhibits resonant enhancement determined by the antenna length. These resonant scattering probes can enable THz near-field imaging applications where THz contrast is weak, such as 2D materials or biological systems.
| Original language | English |
|---|---|
| Title of host publication | IRMMW-THz 2019 - 44th International Conference on Infrared, Millimeter, and Terahertz Waves |
| Publisher | IEEE Computer Society Press |
| ISBN (Electronic) | 9781538682852 |
| DOIs | |
| Publication status | Published - Sept 2019 |
| Event | 44th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2019 - Paris, France Duration: 1 Sept 2019 → 6 Sept 2019 |
Publication series
| Name | International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz |
|---|---|
| Volume | 2019-September |
| ISSN (Print) | 2162-2027 |
| ISSN (Electronic) | 2162-2035 |
Conference
| Conference | 44th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2019 |
|---|---|
| Country/Territory | France |
| City | Paris |
| Period | 1/09/19 → 6/09/19 |
Bibliographical note
Publisher Copyright:© 2019 IEEE.
ASJC Scopus subject areas
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering