Detailed X-ray diffraction analysis of Ce1-xNdxO2-(x/2) as a surrogate for substoichiometric americium oxide

E. J. Watkinson*, D. Chateigner, R. M. Ambrosi, S. Gascoin, H. R. Williams, K. Stephenson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Detailed X-ray diffraction analysis of Ce1-xNdxO2-(x/2) as a surrogate for substoichiometric americium oxide'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science

Chemical Engineering