Abstract
The paper proposes the criteria for selecting the sampling condition in three-dimensional surface measurement. The criteria are based on the fact that there is a relationship between the correlation length of the measured surface and its high-frequency cut-off. Through the use of the sampled surfaces and the analytical models, it is shown that the criteria are equivalent to the power spectral analysis.
| Original language | English |
|---|---|
| Pages (from-to) | 1813-1822 |
| Number of pages | 10 |
| Journal | Measurement Science and Technology |
| Volume | 16 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 1 Sept 2005 |
Keywords
- Correlation length
- Sampling condition
- Surface measurement
ASJC Scopus subject areas
- Instrumentation
- Engineering (miscellaneous)
- Applied Mathematics
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