Correlation-length-based sampling conditions for various engineering surfaces

Anh Tuan Nguyen; David Lee Butler

doi:10.1088/0957-0233/16/9/014

Correlation-length-based sampling conditions for various engineering surfaces

Anh Tuan Nguyen^*, David Lee Butler

^*Corresponding author for this work

Engineering

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

The paper proposes the criteria for selecting the sampling condition in three-dimensional surface measurement. The criteria are based on the fact that there is a relationship between the correlation length of the measured surface and its high-frequency cut-off. Through the use of the sampled surfaces and the analytical models, it is shown that the criteria are equivalent to the power spectral analysis.

Original language	English
Pages (from-to)	1813-1822
Number of pages	10
Journal	Measurement Science and Technology
Volume	16
Issue number	9
DOIs	https://doi.org/10.1088/0957-0233/16/9/014
Publication status	Published - 1 Sept 2005

Keywords

Correlation length
Sampling condition
Surface measurement

ASJC Scopus subject areas

Instrumentation
Engineering (miscellaneous)
Applied Mathematics

Access to Document

10.1088/0957-0233/16/9/014

Cite this

@article{f0634a1684ee4e39a21587245fc6b61b,

title = "Correlation-length-based sampling conditions for various engineering surfaces",

abstract = "The paper proposes the criteria for selecting the sampling condition in three-dimensional surface measurement. The criteria are based on the fact that there is a relationship between the correlation length of the measured surface and its high-frequency cut-off. Through the use of the sampled surfaces and the analytical models, it is shown that the criteria are equivalent to the power spectral analysis.",

keywords = "Correlation length, Sampling condition, Surface measurement",

author = "Nguyen, {Anh Tuan} and Butler, {David Lee}",

year = "2005",

month = sep,

day = "1",

doi = "10.1088/0957-0233/16/9/014",

language = "English",

volume = "16",

pages = "1813--1822",

journal = "Measurement Science and Technology",

issn = "0957-0233",

publisher = "IOP Publishing",

number = "9",

}

TY - JOUR

T1 - Correlation-length-based sampling conditions for various engineering surfaces

AU - Nguyen, Anh Tuan

AU - Butler, David Lee

PY - 2005/9/1

Y1 - 2005/9/1

N2 - The paper proposes the criteria for selecting the sampling condition in three-dimensional surface measurement. The criteria are based on the fact that there is a relationship between the correlation length of the measured surface and its high-frequency cut-off. Through the use of the sampled surfaces and the analytical models, it is shown that the criteria are equivalent to the power spectral analysis.

AB - The paper proposes the criteria for selecting the sampling condition in three-dimensional surface measurement. The criteria are based on the fact that there is a relationship between the correlation length of the measured surface and its high-frequency cut-off. Through the use of the sampled surfaces and the analytical models, it is shown that the criteria are equivalent to the power spectral analysis.

KW - Correlation length

KW - Sampling condition

KW - Surface measurement

UR - http://www.scopus.com/inward/record.url?scp=24144473029&partnerID=8YFLogxK

U2 - 10.1088/0957-0233/16/9/014

DO - 10.1088/0957-0233/16/9/014

M3 - Article

AN - SCOPUS:24144473029

SN - 0957-0233

VL - 16

SP - 1813

EP - 1822

JO - Measurement Science and Technology

JF - Measurement Science and Technology

IS - 9

ER -

Correlation-length-based sampling conditions for various engineering surfaces

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Fingerprint

Cite this