Compression Testing By Nanomanipulation in Environmental Scanning Electron Microscope

JD Stenson, Y Ren, AM Donald, Zhibing Zhang

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@article{e100a90c70074f90b250819af998cf1d,

title = "Compression Testing By Nanomanipulation in Environmental Scanning Electron Microscope",

author = "JD Stenson and Y Ren and AM Donald and Zhibing Zhang",

year = "2010",

month = mar,

day = "1",

doi = "10.1111/j.1747-1567.2009.00529.x",

language = "English",

volume = "34",

pages = "60--62",

journal = "Experimental Techniques",

publisher = "Society for Experimental Mechanics",

number = "2",

}

TY - JOUR

T1 - Compression Testing By Nanomanipulation in Environmental Scanning Electron Microscope

AU - Stenson, JD

AU - Ren, Y

AU - Donald, AM

AU - Zhang, Zhibing

PY - 2010/3/1

Y1 - 2010/3/1

U2 - 10.1111/j.1747-1567.2009.00529.x

DO - 10.1111/j.1747-1567.2009.00529.x

M3 - Article

VL - 34

SP - 60

EP - 62

JO - Experimental Techniques

JF - Experimental Techniques

IS - 2

ER -