Comparative determination of the α/β phase fraction in α+β-titanium alloys using X-ray diffraction and electron microscopy

M. M. Attallah; S. Zabeen; R. J. Cernik; M. Preuss

doi:10.1016/j.matchar.2009.05.006

Comparative determination of the α/β phase fraction in α+β-titanium alloys using X-ray diffraction and electron microscopy

M. M. Attallah^*, S. Zabeen, R. J. Cernik, M. Preuss

^*Corresponding author for this work

Metallurgy and Materials

Research output: Contribution to journal › Article › peer-review

Abstract

A comparison is made between the measured α/β phase fractions in Ti-6246 using X-ray diffraction (XRD) and electron microscopy. Image analysis of SEM and TEM images was compared to the phase fraction estimate obtained using electron backscattered diffraction, lab and high-energy synchrotron XRD. There was a good agreement between the electron microscopic and diffraction techniques, provided that the microstructural parameters of grain size and texture are estimated correctly when using quantitative Rietveld refinement.

Original language	English
Pages (from-to)	1248-1256
Number of pages	9
Journal	Materials Characterization
Volume	60
Issue number	11
DOIs	https://doi.org/10.1016/j.matchar.2009.05.006
Publication status	Published - Nov 2009

Bibliographical note

Funding Information:
The authors would like to thank Rolls-Royce plc for the financial support and provision of material for this research. The authors gratefully acknowledge the European Synchrotron Radiation Facility, as well as the staff of beamline ID31 for their experimental assistance.

Keywords

Electron microscopy
Image analysis
Titanium alloys
X-ray diffraction

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.1016/j.matchar.2009.05.006

Cite this

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title = "Comparative determination of the α/β phase fraction in α+β-titanium alloys using X-ray diffraction and electron microscopy",

abstract = "A comparison is made between the measured α/β phase fractions in Ti-6246 using X-ray diffraction (XRD) and electron microscopy. Image analysis of SEM and TEM images was compared to the phase fraction estimate obtained using electron backscattered diffraction, lab and high-energy synchrotron XRD. There was a good agreement between the electron microscopic and diffraction techniques, provided that the microstructural parameters of grain size and texture are estimated correctly when using quantitative Rietveld refinement.",

keywords = "Electron microscopy, Image analysis, Titanium alloys, X-ray diffraction",

author = "Attallah, {M. M.} and S. Zabeen and Cernik, {R. J.} and M. Preuss",

note = "Funding Information: The authors would like to thank Rolls-Royce plc for the financial support and provision of material for this research. The authors gratefully acknowledge the European Synchrotron Radiation Facility, as well as the staff of beamline ID31 for their experimental assistance. ",

year = "2009",

month = nov,

doi = "10.1016/j.matchar.2009.05.006",

language = "English",

volume = "60",

pages = "1248--1256",

journal = "Materials Characterization",

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T1 - Comparative determination of the α/β phase fraction in α+β-titanium alloys using X-ray diffraction and electron microscopy

AU - Attallah, M. M.

AU - Zabeen, S.

AU - Cernik, R. J.

AU - Preuss, M.

N1 - Funding Information: The authors would like to thank Rolls-Royce plc for the financial support and provision of material for this research. The authors gratefully acknowledge the European Synchrotron Radiation Facility, as well as the staff of beamline ID31 for their experimental assistance.

PY - 2009/11

Y1 - 2009/11

N2 - A comparison is made between the measured α/β phase fractions in Ti-6246 using X-ray diffraction (XRD) and electron microscopy. Image analysis of SEM and TEM images was compared to the phase fraction estimate obtained using electron backscattered diffraction, lab and high-energy synchrotron XRD. There was a good agreement between the electron microscopic and diffraction techniques, provided that the microstructural parameters of grain size and texture are estimated correctly when using quantitative Rietveld refinement.

AB - A comparison is made between the measured α/β phase fractions in Ti-6246 using X-ray diffraction (XRD) and electron microscopy. Image analysis of SEM and TEM images was compared to the phase fraction estimate obtained using electron backscattered diffraction, lab and high-energy synchrotron XRD. There was a good agreement between the electron microscopic and diffraction techniques, provided that the microstructural parameters of grain size and texture are estimated correctly when using quantitative Rietveld refinement.

KW - Electron microscopy

KW - Image analysis

KW - Titanium alloys

KW - X-ray diffraction

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DO - 10.1016/j.matchar.2009.05.006

M3 - Article

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SN - 1044-5803

VL - 60

SP - 1248

EP - 1256

JO - Materials Characterization

JF - Materials Characterization

IS - 11

ER -

Comparative determination of the α/β phase fraction in α+β-titanium alloys using X-ray diffraction and electron microscopy

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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