Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy

BL Weeks; ZH Barber; M Raval; ME Welland; Trevor Rayment

doi:10.1016/S0304-3991(00)00066-8

Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy

BL Weeks
, ZH Barber
, M Raval
, ME Welland
, Trevor Rayment

Chemistry

Research output: Contribution to journal › Article

1 Citation (Scopus)

Abstract

A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.

Original language	English
Pages (from-to)	19-23
Number of pages	5
Journal	Ultramicroscopy
Volume	87
DOIs	https://doi.org/10.1016/S0304-3991(00)00066-8
Publication status	Published - 1 Jan 2001

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title = "Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy",

abstract = "A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.",

author = "BL Weeks and ZH Barber and M Raval and ME Welland and Trevor Rayment",

year = "2001",

month = jan,

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doi = "10.1016/S0304-3991(00)00066-8",

language = "English",

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pages = "19--23",

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T1 - Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy

AU - Weeks, BL

AU - Barber, ZH

AU - Raval, M

AU - Welland, ME

AU - Rayment, Trevor

PY - 2001/1/1

Y1 - 2001/1/1

N2 - A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.

AB - A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.

UR - https://www.scopus.com/pages/publications/0035099516

U2 - 10.1016/S0304-3991(00)00066-8

DO - 10.1016/S0304-3991(00)00066-8

M3 - Article

C2 - 11310538

VL - 87

SP - 19

EP - 23

JO - Ultramicroscopy

JF - Ultramicroscopy

ER -

Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy

Abstract

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