TY - JOUR
T1 - Coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy
AU - Weeks, BL
AU - Barber, ZH
AU - Raval, M
AU - Welland, ME
AU - Rayment, Trevor
PY - 2001/1/1
Y1 - 2001/1/1
N2 - A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.
AB - A novel application of coated silica tips for use in high-pressure, high-temperature, scanning tunneling microscopy is introduced. Thermal drift is reduced in the Z-direction due to the low thermal expansion of silica. Virtually, any conducting material that can be evaporated or sputtered can be used as a tip material. Experimental results are shown for tips sputter coated with platinum, along with images obtained.
UR - http://www.scopus.com/inward/record.url?scp=0035099516&partnerID=8YFLogxK
U2 - 10.1016/S0304-3991(00)00066-8
DO - 10.1016/S0304-3991(00)00066-8
M3 - Article
C2 - 11310538
SN - 0304-3991
VL - 87
SP - 19
EP - 23
JO - Ultramicroscopy
JF - Ultramicroscopy
ER -