Biaxial testing of thin functional structures used in flexible display and touch-screen applications

Konstantinos A. Sierros; J. Stuart Abell; Stephen N. Kukureka

Biaxial testing of thin functional structures used in flexible display and touch-screen applications

Konstantinos A. Sierros^*
, J. Stuart Abell
, Stephen N. Kukureka

^*Corresponding author for this work

Metallurgy and Materials

Research output: Contribution to conference (unpublished) › Paper › peer-review

1 Citation (Scopus)

Abstract

We report results of a newly developed experimental technique used to measure the critical biaxial strain at which a brittle indium tin oxide (ITO) conductive coating deposited on a polyethylene napthalate (PEN) substrate starts to crack, by means of a bulge apparatus coupled with resistance measurement.

Original language	English
Pages	229-232
Number of pages	4
Publication status	Published - 1 Dec 2005
Event	Second Americas Display Engineering and Applications Conference, ADEAC 2005 - Portland, OR, United States Duration: 25 Oct 2005 → 27 Oct 2005

Conference

Conference	Second Americas Display Engineering and Applications Conference, ADEAC 2005
Country/Territory	United States
City	Portland, OR
Period	25/10/05 → 27/10/05

Keywords

Bulge test
Critical onset biaxial strain
ITO
Polyethylene naphtalate (PEN) films

ASJC Scopus subject areas

General Engineering

Cite this

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title = "Biaxial testing of thin functional structures used in flexible display and touch-screen applications",

abstract = "We report results of a newly developed experimental technique used to measure the critical biaxial strain at which a brittle indium tin oxide (ITO) conductive coating deposited on a polyethylene napthalate (PEN) substrate starts to crack, by means of a bulge apparatus coupled with resistance measurement.",

keywords = "Bulge test, Critical onset biaxial strain, ITO, Polyethylene naphtalate (PEN) films",

author = "Sierros, \{Konstantinos A.\} and Abell, \{J. Stuart\} and Kukureka, \{Stephen N.\}",

year = "2005",

month = dec,

day = "1",

language = "English",

pages = "229--232",

note = "Second Americas Display Engineering and Applications Conference, ADEAC 2005 ; Conference date: 25-10-2005 Through 27-10-2005",

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Biaxial testing of thin functional structures used in flexible display and touch-screen applications. / Sierros, Konstantinos A.; Abell, J. Stuart; Kukureka, Stephen N.
2005. 229-232 Paper presented at Second Americas Display Engineering and Applications Conference, ADEAC 2005, Portland, OR, United States.

Research output: Contribution to conference (unpublished) › Paper › peer-review

TY - CONF

T1 - Biaxial testing of thin functional structures used in flexible display and touch-screen applications

AU - Sierros, Konstantinos A.

AU - Abell, J. Stuart

AU - Kukureka, Stephen N.

PY - 2005/12/1

Y1 - 2005/12/1

N2 - We report results of a newly developed experimental technique used to measure the critical biaxial strain at which a brittle indium tin oxide (ITO) conductive coating deposited on a polyethylene napthalate (PEN) substrate starts to crack, by means of a bulge apparatus coupled with resistance measurement.

AB - We report results of a newly developed experimental technique used to measure the critical biaxial strain at which a brittle indium tin oxide (ITO) conductive coating deposited on a polyethylene napthalate (PEN) substrate starts to crack, by means of a bulge apparatus coupled with resistance measurement.

KW - Bulge test

KW - Critical onset biaxial strain

KW - ITO

KW - Polyethylene naphtalate (PEN) films

UR - https://www.scopus.com/pages/publications/33644748297

M3 - Paper

AN - SCOPUS:33644748297

SP - 229

EP - 232

T2 - Second Americas Display Engineering and Applications Conference, ADEAC 2005

Y2 - 25 October 2005 through 27 October 2005

ER -

Biaxial testing of thin functional structures used in flexible display and touch-screen applications

Abstract

Conference

Keywords

ASJC Scopus subject areas

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Cite this