Biaxial testing of thin functional structures used in flexible display and touch-screen applications

Konstantinos A. Sierros, J. Stuart Abell, Stephen N. Kukureka

Research output: Contribution to conference (unpublished)Paperpeer-review

1 Citation (Scopus)

Abstract

We report results of a newly developed experimental technique used to measure the critical biaxial strain at which a brittle indium tin oxide (ITO) conductive coating deposited on a polyethylene napthalate (PEN) substrate starts to crack, by means of a bulge apparatus coupled with resistance measurement.

Original languageEnglish
Pages229-232
Number of pages4
Publication statusPublished - 1 Dec 2005
EventSecond Americas Display Engineering and Applications Conference, ADEAC 2005 - Portland, OR, United States
Duration: 25 Oct 200527 Oct 2005

Conference

ConferenceSecond Americas Display Engineering and Applications Conference, ADEAC 2005
Country/TerritoryUnited States
CityPortland, OR
Period25/10/0527/10/05

Keywords

  • Bulge test
  • Critical onset biaxial strain
  • ITO
  • Polyethylene naphtalate (PEN) films

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint

Dive into the research topics of 'Biaxial testing of thin functional structures used in flexible display and touch-screen applications'. Together they form a unique fingerprint.

Cite this