Abstract
We report results of a newly developed experimental technique used to measure the critical biaxial strain at which a brittle indium tin oxide (ITO) conductive coating deposited on a polyethylene napthalate (PEN) substrate starts to crack, by means of a bulge apparatus coupled with resistance measurement.
Original language | English |
---|---|
Pages | 229-232 |
Number of pages | 4 |
Publication status | Published - 1 Dec 2005 |
Event | Second Americas Display Engineering and Applications Conference, ADEAC 2005 - Portland, OR, United States Duration: 25 Oct 2005 → 27 Oct 2005 |
Conference
Conference | Second Americas Display Engineering and Applications Conference, ADEAC 2005 |
---|---|
Country/Territory | United States |
City | Portland, OR |
Period | 25/10/05 → 27/10/05 |
Keywords
- Bulge test
- Critical onset biaxial strain
- ITO
- Polyethylene naphtalate (PEN) films
ASJC Scopus subject areas
- Engineering(all)