Biaxial testing of thin functional structures used in flexible display and touch-screen applications

Konstantinos Sierros, John Abell, Stephen Kukureka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the Twenty-Fifth International Display Research Conference, EuroDisplay 2005
Pages229-232
Number of pages4
Publication statusPublished - 1 Jan 2005
EventTwenty-Fifth International Display Research Conference - Eurodisplay 2005 - Edinburgh, United Kingdom
Duration: 20 Sept 200522 Sept 2005

Conference

ConferenceTwenty-Fifth International Display Research Conference - Eurodisplay 2005
Country/TerritoryUnited Kingdom
CityEdinburgh
Period20/09/0522/09/05

Keywords

  • ITO
  • critical onset biaxial strain
  • polyethylene naphtalate (PEN) films
  • bulge test

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