Automated High-Resolution Phase-Contrast Scanning Transmission Electron Microscopy

Alexander J. Pattison; Cassio C.S. Pedroso; Bruce E. Cohen; Justin C. Ondry; A. Paul Alivisatos; Wolfgang Theis; Peter Ercius

doi:10.1093/mam/ozae044.192

Automated High-Resolution Phase-Contrast Scanning Transmission Electron Microscopy

Alexander J. Pattison
, Cassio C.S. Pedroso
, Bruce E. Cohen
, Justin C. Ondry
, A. Paul Alivisatos
, Wolfgang Theis
, Peter Ercius^*

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Abstract › peer-review

Original language	English
Article number	ozae044.192
Pages (from-to)	420-421
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
Issue number	Supplement_1
DOIs	https://doi.org/10.1093/mam/ozae044.192
Publication status	Published - 24 Jul 2024
Event	82nd Annual Meeting of the Microscopy Society of America and the 58th Annual Meeting of the Microanalysis Society, M and M 2024 - Cleveland, United States Duration: 28 Jul 2024 → 1 Aug 2024 https://mm2024.eventscribe.net/

ASJC Scopus subject areas

Instrumentation

Access to Document

10.1093/mam/ozae044.192Licence: None: All rights reserved

Cite this

@article{e7abe28760d2487790592ecb6485205c,

title = "Automated High-Resolution Phase-Contrast Scanning Transmission Electron Microscopy",

author = "Pattison, \{Alexander J.\} and Pedroso, \{Cassio C.S.\} and Cohen, \{Bruce E.\} and Ondry, \{Justin C.\} and Alivisatos, \{A. Paul\} and Wolfgang Theis and Peter Ercius",

year = "2024",

month = jul,

day = "24",

doi = "10.1093/mam/ozae044.192",

language = "English",

volume = "30",

pages = "420--421",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "Supplement\_1",

note = "82nd Annual Meeting of the Microscopy Society of America and the 58th Annual Meeting of the Microanalysis Society, M and M 2024, M\&M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

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TY - JOUR

T1 - Automated High-Resolution Phase-Contrast Scanning Transmission Electron Microscopy

AU - Pattison, Alexander J.

AU - Pedroso, Cassio C.S.

AU - Cohen, Bruce E.

AU - Ondry, Justin C.

AU - Alivisatos, A. Paul

AU - Theis, Wolfgang

AU - Ercius, Peter

PY - 2024/7/24

Y1 - 2024/7/24

U2 - 10.1093/mam/ozae044.192

DO - 10.1093/mam/ozae044.192

M3 - Abstract

AN - SCOPUS:85215683082

SN - 1431-9276

VL - 30

SP - 420

EP - 421

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Supplement_1

M1 - ozae044.192

T2 - 82nd Annual Meeting of the Microscopy Society of America and the 58th Annual Meeting of the Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024

ER -