Fingerprint
Dive into the research topics of 'Applications and systematic errors of X-ray computed tomography associated with dimensional metrology'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Applications and systematic errors of X-ray computed tomography associated with dimensional metrology
Wenjuan Sun, Stephen Brown, Peter Woolliams, Michael McCarthy, Jan White, Moataz Attallah
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution