Applications and systematic errors of X-ray computed tomography associated with dimensional metrology

Wenjuan Sun; Stephen Brown; Peter Woolliams; Michael McCarthy; Jan White; Moataz Attallah

Applications and systematic errors of X-ray computed tomography associated with dimensional metrology

Wenjuan Sun, Stephen Brown, Peter Woolliams, Michael McCarthy, Jan White, Moataz Attallah

Metallurgy and Materials

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

X-ray computed tomography (XCT) is increasingly being used in many industrial quality control applications due to its ability to visualise in three dimensions both the external and internal structure of parts and to detect defects without contact or damage to that part. XCT technology also has the potential to deliver critical dimensional measurements at the micrometre level. However, the quality of these measurements can be limited by a number of systematic errors associated with the technology, for example, beam hardening and cone beam effects. In this paper, beam hardening and cone beam errors associated with the cone beam XCT are described together with their impact on typical dimensional measurements.

Original language	English
Title of host publication	55th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2016
Publisher	British Institute of Non-Destructive Testing
Pages	337-345
Number of pages	9
ISBN (Electronic)	9781510830943
Publication status	Published - 2016
Event	55th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2016 - Nottingham, United Kingdom Duration: 12 Sept 2016 → 14 Sept 2016

Conference

Conference	55th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2016
Country/Territory	United Kingdom
City	Nottingham
Period	12/09/16 → 14/09/16

ASJC Scopus subject areas

Mechanical Engineering
Industrial and Manufacturing Engineering
Safety, Risk, Reliability and Quality

Cite this

@inproceedings{94557036108f4c6ca0656c2e40397672,

title = "Applications and systematic errors of X-ray computed tomography associated with dimensional metrology",

abstract = "X-ray computed tomography (XCT) is increasingly being used in many industrial quality control applications due to its ability to visualise in three dimensions both the external and internal structure of parts and to detect defects without contact or damage to that part. XCT technology also has the potential to deliver critical dimensional measurements at the micrometre level. However, the quality of these measurements can be limited by a number of systematic errors associated with the technology, for example, beam hardening and cone beam effects. In this paper, beam hardening and cone beam errors associated with the cone beam XCT are described together with their impact on typical dimensional measurements.",

author = "Wenjuan Sun and Stephen Brown and Peter Woolliams and Michael McCarthy and Jan White and Moataz Attallah",

year = "2016",

language = "English",

pages = "337--345",

booktitle = "55th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2016",

publisher = "British Institute of Non-Destructive Testing",

note = "55th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2016 ; Conference date: 12-09-2016 Through 14-09-2016",

}

Sun, W, Brown, S, Woolliams, P, McCarthy, M, White, J & Attallah, M 2016, Applications and systematic errors of X-ray computed tomography associated with dimensional metrology. in 55th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2016. British Institute of Non-Destructive Testing, pp. 337-345, 55th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2016, Nottingham, United Kingdom, 12/09/16.

Applications and systematic errors of X-ray computed tomography associated with dimensional metrology. / Sun, Wenjuan; Brown, Stephen; Woolliams, Peter et al.
55th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2016. British Institute of Non-Destructive Testing, 2016. p. 337-345.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Applications and systematic errors of X-ray computed tomography associated with dimensional metrology

AU - Sun, Wenjuan

AU - Brown, Stephen

AU - Woolliams, Peter

AU - McCarthy, Michael

AU - White, Jan

AU - Attallah, Moataz

PY - 2016

Y1 - 2016

N2 - X-ray computed tomography (XCT) is increasingly being used in many industrial quality control applications due to its ability to visualise in three dimensions both the external and internal structure of parts and to detect defects without contact or damage to that part. XCT technology also has the potential to deliver critical dimensional measurements at the micrometre level. However, the quality of these measurements can be limited by a number of systematic errors associated with the technology, for example, beam hardening and cone beam effects. In this paper, beam hardening and cone beam errors associated with the cone beam XCT are described together with their impact on typical dimensional measurements.

AB - X-ray computed tomography (XCT) is increasingly being used in many industrial quality control applications due to its ability to visualise in three dimensions both the external and internal structure of parts and to detect defects without contact or damage to that part. XCT technology also has the potential to deliver critical dimensional measurements at the micrometre level. However, the quality of these measurements can be limited by a number of systematic errors associated with the technology, for example, beam hardening and cone beam effects. In this paper, beam hardening and cone beam errors associated with the cone beam XCT are described together with their impact on typical dimensional measurements.

UR - http://www.scopus.com/inward/record.url?scp=85009858781&partnerID=8YFLogxK

UR - http://www.proceedings.com/32119.html

M3 - Conference contribution

AN - SCOPUS:85009858781

SP - 337

EP - 345

BT - 55th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2016

PB - British Institute of Non-Destructive Testing

T2 - 55th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2016

Y2 - 12 September 2016 through 14 September 2016

ER -

Applications and systematic errors of X-ray computed tomography associated with dimensional metrology

Abstract

Conference

ASJC Scopus subject areas

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