Projects per year
Abstract
A novel method has been developed for preparing in situ straining samples for transmission electron microscopy (TEM) to study dislocation behaviour, here transmission through phase interfaces. A dual-beam focussed ion beam microscope was used to extract oriented foils from locations with specific crystallography in a sample area which had been selected using electron backscattered diffraction (EBSD). The foil was attached to a pre-prepared substrate which was then strained in a transmission electron microscope. The method has been demonstrated successfully by studying 〈c + a〉 dislocation transmission through α/β interfaces in a commercial Ti-6Al-4V alloy. However, bending of the foil prevented the actual transmission from being further characterized.
Original language | English |
---|---|
Pages (from-to) | 31-36 |
Number of pages | 6 |
Journal | Journal of Electron Microscopy |
Volume | 61 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1 Feb 2012 |
Fingerprint
Dive into the research topics of 'Application of a novel EBSD-FIB method to the transmission of c + a dislocations through / interfaces Ti-6Al-4V for producing in situ tension transmission electron microscopy specimens'. Together they form a unique fingerprint.Projects
- 2 Finished
-
Structural Metallic Systems For Advanced Gas Turbine Applications
Bowen, P. (Principal Investigator), Chiu, Y.-L. (Co-Investigator) & Reed, R. (Co-Investigator)
Engineering & Physical Science Research Council
1/10/09 → 30/09/14
Project: Research Councils
-
Effective Structural Unit Size in Polycrystals: Formation, Quantification and micromechanical Behaviour
Jones, I. (Principal Investigator)
Engineering & Physical Science Research Council
1/02/08 → 31/01/11
Project: Research Councils