Application of a novel EBSD-FIB method to the transmission of c + a dislocations through  /  interfaces Ti-6Al-4V for producing in situ tension transmission electron microscopy specimens

A novel method has been developed for preparing in situ straining samples for transmission electron microscopy (TEM) to study dislocation behaviour, here transmission through phase interfaces. A dual-beam focussed ion beam microscope was used to extract oriented foils from locations with specific crystallography in a sample area which had been selected using electron backscattered diffraction (EBSD). The foil was attached to a pre-prepared substrate which was then strained in a transmission electron microscope. The method has been demonstrated successfully by studying 〈c + a〉 dislocation transmission through α/β interfaces in a commercial Ti-6Al-4V alloy. However, bending of the foil prevented the actual transmission from being further characterized.