Analysis of Low Signal-to-Noise Atomic Resolution Spectroscopy of Radiation-Induced Sublattice Disorder in Ferritic Superalloys

Thomas W. Pfeifer; Kan Ma; Nianhua Peng; Alexander Knowles; Jordan Hachtel; Eric R. Hoglund; Patrick E. Hopkins

doi:10.1093/mam/ozae044.655

Analysis of Low Signal-to-Noise Atomic Resolution Spectroscopy of Radiation-Induced Sublattice Disorder in Ferritic Superalloys

Thomas W. Pfeifer, Kan Ma, Nianhua Peng, Alexander Knowles, Jordan Hachtel, Eric R. Hoglund, Patrick E. Hopkins

Metallurgy and Materials

Research output: Contribution to journal › Abstract › peer-review

Original language	English
Pages (from-to)	1326-1327
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
Issue number	Supplement_1
DOIs	https://doi.org/10.1093/mam/ozae044.655
Publication status	Published - 24 Jul 2024
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: 28 Jul 2024 → 1 Aug 2024

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10.1093/mam/ozae044.655

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Metallurgy and Materials
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title = "Analysis of Low Signal-to-Noise Atomic Resolution Spectroscopy of Radiation-Induced Sublattice Disorder in Ferritic Superalloys",

author = "Pfeifer, \{Thomas W.\} and Kan Ma and Nianhua Peng and Alexander Knowles and Jordan Hachtel and Hoglund, \{Eric R.\} and Hopkins, \{Patrick E.\}",

year = "2024",

month = jul,

day = "24",

doi = "10.1093/mam/ozae044.655",

language = "English",

volume = "30",

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journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

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note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

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T1 - Analysis of Low Signal-to-Noise Atomic Resolution Spectroscopy of Radiation-Induced Sublattice Disorder in Ferritic Superalloys

AU - Pfeifer, Thomas W.

AU - Ma, Kan

AU - Peng, Nianhua

AU - Knowles, Alexander

AU - Hachtel, Jordan

AU - Hoglund, Eric R.

AU - Hopkins, Patrick E.

PY - 2024/7/24

Y1 - 2024/7/24

UR - http://www.scopus.com/inward/record.url?scp=85215660599&partnerID=8YFLogxK

U2 - 10.1093/mam/ozae044.655

DO - 10.1093/mam/ozae044.655

M3 - Abstract

AN - SCOPUS:85215660599

SN - 1431-9276

VL - 30

SP - 1326

EP - 1327

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Supplement_1

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

Analysis of Low Signal-to-Noise Atomic Resolution Spectroscopy of Radiation-Induced Sublattice Disorder in Ferritic Superalloys

ASJC Scopus subject areas

Access to Document

Equipment

Facility for Electron Microscopy

Cite this