All-optical subcycle microscopy on atomic length scales

T. Siday, J. Hayes, F. Schiegl, F. Sandner, P. Menden, V. Bergbauer, M. Zizlsperger, S. Nerreter, S. Lingl, J. Repp, J. Wilhelm*, M. A. Huber*, Y. A. Gerasimenko*, R. Huber

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Bringing optical microscopy to the shortest possible length and time scales has been a long-sought goal, connecting nanoscopic elementary dynamics with the macroscopic functionalities of condensed matter. Super-resolution microscopy has circumvented the far-field diffraction limit by harnessing optical nonlinearities1. By exploiting linear interaction with tip-confined evanescent light fields2, near-field microscopy3,4 has reached even higher resolution, prompting a vibrant research field by exploring the nanocosm in motion5–19. Yet the finite radius of the nanometre-sized tip apex has prevented access to atomic resolution20. Here we leverage extreme atomic nonlinearities within tip-confined evanescent fields to push all-optical microscopy to picometric spatial and femtosecond temporal resolution. On these scales, we discover an unprecedented and efficient non-classical near-field response, in phase with the vector potential of light and strictly confined to atomic dimensions. This ultrafast signal is characterized by an optical phase delay of approximately π/2 and facilitates direct monitoring of tunnelling dynamics. We showcase the power of our optical concept by imaging nanometre-sized defects hidden to atomic force microscopy and by subcycle sampling of current transients on a semiconducting van der Waals material. Our results facilitate access to quantum light–matter interaction and electronic dynamics at ultimately short spatio-temporal scales in both conductive and insulating quantum materials.

Original languageEnglish
Pages (from-to)329-334
Number of pages6
JournalNature
Volume629
Issue number8011
Early online date8 May 2024
DOIs
Publication statusPublished - 9 May 2024

Bibliographical note

Publisher Copyright:
© The Author(s), under exclusive licence to Springer Nature Limited 2024.

ASJC Scopus subject areas

  • General

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