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All-optical microscopy with combined subcycle temporal and atomic-scale spatial resolution

  • F. Schiegl
  • , T. Siday
  • , J. Hayes
  • , F. Sandner
  • , P. Menden
  • , V. Bergbauer
  • , M. Zizlsperger
  • , S. Nerreter
  • , S. Lingl
  • , J. Repp
  • , J. Wilhelm
  • , M. A. Huber
  • , Y. A. Gerasimenko
  • , R. Huber

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a novel contrast mechanism in near-field microscopy that enables all-optical atomic-scale imaging with subcycle temporal resolution. This approach hinges upon the idea of performing near-field microscopy under ultrahigh vacuum conditions, at low temperatures, and with sub-nanometer tip tapping amplitudes. At these scales, a remarkably efficient non-classical near-field response emerges, tightly confined to atomic dimensions and governed by the light's vector potential. This ultrafast signal is characterized by an optical phase delay of approximately π/2, allowing precise tracking of tunneling dynamics. Our method uncovers nanoscale defects and captures current transients in semiconducting van der Waals materials with subcycle sampling. This capability enables the real-time recording of the quantum flow of electrons in both conductive and insulating quantum materials, achieving ultimate spatiotemporal resolution.

Original languageEnglish
Title of host publicationTerahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVIII
EditorsLaurence P. Sadwick, Tianxin Yang
PublisherSPIE
Number of pages3
ISBN (Print)9781510684782
DOIs
Publication statusPublished - 19 Mar 2025
EventTerahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVIII 2025 - San Francisco, United States
Duration: 27 Jan 202530 Jan 2025

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13365
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceTerahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVIII 2025
Country/TerritoryUnited States
CitySan Francisco
Period27/01/2530/01/25

Bibliographical note

Publisher Copyright:
© 2025 SPIE.

Keywords

  • all-optical microscopy
  • atomic resolution
  • near field microscopy
  • subcycle resolution
  • terahertz
  • ultrafast nanoscopy
  • van-der-Waals materials

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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