Abstract
We present a novel contrast mechanism in near-field microscopy that enables all-optical atomic-scale imaging with subcycle temporal resolution. This approach hinges upon the idea of performing near-field microscopy under ultrahigh vacuum conditions, at low temperatures, and with sub-nanometer tip tapping amplitudes. At these scales, a remarkably efficient non-classical near-field response emerges, tightly confined to atomic dimensions and governed by the light's vector potential. This ultrafast signal is characterized by an optical phase delay of approximately π/2, allowing precise tracking of tunneling dynamics. Our method uncovers nanoscale defects and captures current transients in semiconducting van der Waals materials with subcycle sampling. This capability enables the real-time recording of the quantum flow of electrons in both conductive and insulating quantum materials, achieving ultimate spatiotemporal resolution.
| Original language | English |
|---|---|
| Title of host publication | Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVIII |
| Editors | Laurence P. Sadwick, Tianxin Yang |
| Publisher | SPIE |
| Number of pages | 3 |
| ISBN (Print) | 9781510684782 |
| DOIs | |
| Publication status | Published - 19 Mar 2025 |
| Event | Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVIII 2025 - San Francisco, United States Duration: 27 Jan 2025 → 30 Jan 2025 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Volume | 13365 |
| ISSN (Print) | 0277-786X |
| ISSN (Electronic) | 1996-756X |
Conference
| Conference | Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVIII 2025 |
|---|---|
| Country/Territory | United States |
| City | San Francisco |
| Period | 27/01/25 → 30/01/25 |
Bibliographical note
Publisher Copyright:© 2025 SPIE.
Keywords
- all-optical microscopy
- atomic resolution
- near field microscopy
- subcycle resolution
- terahertz
- ultrafast nanoscopy
- van-der-Waals materials
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
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