One approach for a novel EUV resist is the multi-trigger concept wherein a reaction will only occur when multiple elements of the resist are initiated concurrently and in close spatial proximity. We present results focused on the enhancement of the high-opacity MTR resist which shows a decrease in dose and improvement in Z-factor using a higher activation energy MTR molecule for pitch 32nm dense lines. We present pillars at p40 with a diameter of 24nm, dose of 72mJ/cm2, with a CDU of 2.63nm.
|Proceedings of SPIE
|International Conference on Extreme Ultraviolet Lithography 2021
|27/09/21 → 2/10/21