Advanced techniques in automated high-resolution scanning transmission electron microscopy

Alexander J. Pattison, Cassio C.S. Pedroso, Bruce E. Cohen, Justin C. Ondry, A. Paul Alivisatos, Wolfgang Theis, Peter Ercius*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its versatility, however, experimental workflows currently rely heavily on experienced human operators and can only acquire data from small regions of a sample at a time. Here, we demonstrate a flexible pipeline-based system for high-throughput acquisition of atomic-resolution structural data using an all-piezo sample stage applied to large-scale imaging of nanoparticles and multimodal data acquisition. The system is available as part of the user program of the Molecular Foundry at Lawrence Berkeley National Laboratory.

Original languageEnglish
Article number015710
Number of pages12
JournalNanotechnology
Volume35
Issue number1
Early online date20 Oct 2023
DOIs
Publication statusPublished - 1 Jan 2024

Keywords

  • 4D-STEM
  • automation
  • Bayesian optimization
  • scanning transmission electron microscopy

ASJC Scopus subject areas

  • Bioengineering
  • General Chemistry
  • General Materials Science
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering

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