Advanced aging failure model for overhead conductors

Wilson Vasquez; Dilan Jayaweera; J Játiva-Ibarra

doi:10.1109/ISGTEurope.2017.8260134

Advanced aging failure model for overhead conductors

Wilson Vasquez , Dilan Jayaweera, J Játiva-Ibarra

Electronic, Electrical and Systems Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Citations (Scopus)

830 Downloads (Pure)

Abstract

Aging failure modeling is a fundamental requirement in reliability assessment of any actual power system. The level of model detail can potentially reflect realistic means of reliability indices. In that context, this paper proposes an advanced end-oflife failure model for overhead lines (OHLs), incorporating the
effects of loading and weather conditions into the aging failure probability calculation. The Arrhenius life-temperature relationship is used to model the lifetime of OHLs as a function of conductor temperature. The life measure of the Arrhenius model is adopted as the scale parameter of the Weibull probability
distribution. The approach to estimate parameters of the resulting Arrhenius-Weibull distribution is described in detail. Unavailability calculations are performed using the proposed aging failure model for a distribution test system. The results show that if the maximum continuous operating temperature is
exceeded, the unavailability of OHLs increases depending on both time period, where the conductor temperature is higher than the threshold, and conductor age.

Original language	English
Title of host publication	2017 IEEE Innovative Smart Grid Technologies
Subtitle of host publication	(ISGT- Europe)
Publisher	IEEE Xplore
ISBN (Electronic)	9781538619537
DOIs	https://doi.org/10.1109/ISGTEurope.2017.8260134
Publication status	Published - 18 Jan 2018
Event	IEEE International Conference on Innovative Smart Grid Technologies Europe (ISGT Europe) - , Italy Duration: 26 Sept 2017 → 29 Sept 2017

Conference

Conference	IEEE International Conference on Innovative Smart Grid Technologies Europe (ISGT Europe)
Country/Territory	Italy
Period	26/09/17 → 29/09/17

Keywords

Aging failure
Arrhenius model
overhead lines
thermal stress
Weibull distribution

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Cite this

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title = "Advanced aging failure model for overhead conductors",

abstract = "Aging failure modeling is a fundamental requirement in reliability assessment of any actual power system. The level of model detail can potentially reflect realistic means of reliability indices. In that context, this paper proposes an advanced end-oflife failure model for overhead lines (OHLs), incorporating theeffects of loading and weather conditions into the aging failure probability calculation. The Arrhenius life-temperature relationship is used to model the lifetime of OHLs as a function of conductor temperature. The life measure of the Arrhenius model is adopted as the scale parameter of the Weibull probabilitydistribution. The approach to estimate parameters of the resulting Arrhenius-Weibull distribution is described in detail. Unavailability calculations are performed using the proposed aging failure model for a distribution test system. The results show that if the maximum continuous operating temperature isexceeded, the unavailability of OHLs increases depending on both time period, where the conductor temperature is higher than the threshold, and conductor age.",

keywords = "Aging failure, Arrhenius model, overhead lines, thermal stress, Weibull distribution",

author = "Wilson Vasquez and Dilan Jayaweera and J J{\'a}tiva-Ibarra",

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T1 - Advanced aging failure model for overhead conductors

AU - Vasquez , Wilson

AU - Jayaweera, Dilan

AU - Játiva-Ibarra , J

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N2 - Aging failure modeling is a fundamental requirement in reliability assessment of any actual power system. The level of model detail can potentially reflect realistic means of reliability indices. In that context, this paper proposes an advanced end-oflife failure model for overhead lines (OHLs), incorporating theeffects of loading and weather conditions into the aging failure probability calculation. The Arrhenius life-temperature relationship is used to model the lifetime of OHLs as a function of conductor temperature. The life measure of the Arrhenius model is adopted as the scale parameter of the Weibull probabilitydistribution. The approach to estimate parameters of the resulting Arrhenius-Weibull distribution is described in detail. Unavailability calculations are performed using the proposed aging failure model for a distribution test system. The results show that if the maximum continuous operating temperature isexceeded, the unavailability of OHLs increases depending on both time period, where the conductor temperature is higher than the threshold, and conductor age.

AB - Aging failure modeling is a fundamental requirement in reliability assessment of any actual power system. The level of model detail can potentially reflect realistic means of reliability indices. In that context, this paper proposes an advanced end-oflife failure model for overhead lines (OHLs), incorporating theeffects of loading and weather conditions into the aging failure probability calculation. The Arrhenius life-temperature relationship is used to model the lifetime of OHLs as a function of conductor temperature. The life measure of the Arrhenius model is adopted as the scale parameter of the Weibull probabilitydistribution. The approach to estimate parameters of the resulting Arrhenius-Weibull distribution is described in detail. Unavailability calculations are performed using the proposed aging failure model for a distribution test system. The results show that if the maximum continuous operating temperature isexceeded, the unavailability of OHLs increases depending on both time period, where the conductor temperature is higher than the threshold, and conductor age.

KW - Aging failure

KW - Arrhenius model

KW - overhead lines

KW - thermal stress

KW - Weibull distribution

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DO - 10.1109/ISGTEurope.2017.8260134

M3 - Conference contribution

BT - 2017 IEEE Innovative Smart Grid Technologies

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T2 - IEEE International Conference on Innovative Smart Grid Technologies Europe (ISGT Europe)

Y2 - 26 September 2017 through 29 September 2017

ER -

Advanced aging failure model for overhead conductors

Abstract

Conference

Keywords

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