Advanced aging failure model for overhead conductors

Wilson A. Vasquez, Dilan Jayaweera, Jesús Játiva-Ibarra

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)
886 Downloads (Pure)

Abstract

Aging failure modeling is a fundamental requirement in reliability assessment of any actual power system. The level of model detail can potentially reflect realistic means of reliability indices. In that context, this paper proposes an advanced aging failure model for overhead conductors, incorporating the effects of loading and weather conditions into the unavailability calculation. The Arrhenius life-temperature relationship is used to model the lifetime of conductors as a function of temperature. The life measure of the Arrhenius model is adopted as the scale parameter of the Weibull probability distribution. The approach to estimate parameters of the resulting Arrhenius-Weibull distribution is described in detail. Unavailability calculations are performed using the proposed aging failure model for a distribution test system. The results show that if the maximum continuous operating temperature is exceeded, the unavailability of overhead conductors increases depending on both time period, where the conductor temperature is higher than the threshold, and conductor age.
Original languageEnglish
Title of host publication2017 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT-Europe)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages6
ISBN (Electronic)9781538619537, 9781538619520 (USB)
ISBN (Print)9781538619544 (PoD)
DOIs
Publication statusPublished - 18 Jan 2018
Event2017 IEEE PES Innovative Smart Grid Technologies Conference Europe, ISGT-Europe 2017 - Torino, Italy
Duration: 26 Sept 201729 Sept 2017

Publication series

NameIEEE PES Innovative Smart Grid Technologies Conference Europe
PublisherIEEE
ISSN (Print)2165-4816
ISSN (Electronic)2165-4824

Conference

Conference2017 IEEE PES Innovative Smart Grid Technologies Conference Europe, ISGT-Europe 2017
Country/TerritoryItaly
CityTorino
Period26/09/1729/09/17

Bibliographical note

Publisher Copyright:
© 2017 IEEE.

Keywords

  • Aging failure modeling
  • Arrhenius relationship
  • Overhead conductors
  • Thermal stress
  • Weibull distribution

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Energy Engineering and Power Technology
  • Computer Networks and Communications

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