Advanced aging failure model for overhead conductors

Wilson Vasquez , Dilan Jayaweera, J Játiva-Ibarra

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)
700 Downloads (Pure)

Abstract

Aging failure modeling is a fundamental requirement in reliability assessment of any actual power system. The level of model detail can potentially reflect realistic means of reliability indices. In that context, this paper proposes an advanced end-oflife failure model for overhead lines (OHLs), incorporating the
effects of loading and weather conditions into the aging failure probability calculation. The Arrhenius life-temperature relationship is used to model the lifetime of OHLs as a function of conductor temperature. The life measure of the Arrhenius model is adopted as the scale parameter of the Weibull probability
distribution. The approach to estimate parameters of the resulting Arrhenius-Weibull distribution is described in detail. Unavailability calculations are performed using the proposed aging failure model for a distribution test system. The results show that if the maximum continuous operating temperature is
exceeded, the unavailability of OHLs increases depending on both time period, where the conductor temperature is higher than the threshold, and conductor age.
Original languageEnglish
Title of host publication2017 IEEE Innovative Smart Grid Technologies
Subtitle of host publication(ISGT- Europe)
PublisherIEEE Xplore
ISBN (Electronic)9781538619537
DOIs
Publication statusPublished - 18 Jan 2018
EventIEEE International Conference on Innovative Smart Grid Technologies Europe (ISGT Europe) - , Italy
Duration: 26 Sep 201729 Sep 2017

Conference

ConferenceIEEE International Conference on Innovative Smart Grid Technologies Europe (ISGT Europe)
Country/TerritoryItaly
Period26/09/1729/09/17

Keywords

  • Aging failure
  • Arrhenius model
  • overhead lines
  • thermal stress
  • Weibull distribution

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