Advanced aging failure model for overhead conductors

Wilson A. Vasquez; Dilan Jayaweera; Jesús Játiva-Ibarra

doi:10.1109/ISGTEurope.2017.8260134

Advanced aging failure model for overhead conductors

Wilson A. Vasquez, Dilan Jayaweera, Jesús Játiva-Ibarra

Electronic, Electrical and Systems Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

6 Citations (Scopus)

861 Downloads (Pure)

Abstract

Aging failure modeling is a fundamental requirement in reliability assessment of any actual power system. The level of model detail can potentially reflect realistic means of reliability indices. In that context, this paper proposes an advanced aging failure model for overhead conductors, incorporating the effects of loading and weather conditions into the unavailability calculation. The Arrhenius life-temperature relationship is used to model the lifetime of conductors as a function of temperature. The life measure of the Arrhenius model is adopted as the scale parameter of the Weibull probability distribution. The approach to estimate parameters of the resulting Arrhenius-Weibull distribution is described in detail. Unavailability calculations are performed using the proposed aging failure model for a distribution test system. The results show that if the maximum continuous operating temperature is exceeded, the unavailability of overhead conductors increases depending on both time period, where the conductor temperature is higher than the threshold, and conductor age.

Original language	English
Title of host publication	2017 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT-Europe)
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Number of pages	6
ISBN (Electronic)	9781538619537, 9781538619520 (USB)
ISBN (Print)	9781538619544 (PoD)
DOIs	https://doi.org/10.1109/ISGTEurope.2017.8260134
Publication status	Published - 18 Jan 2018
Event	2017 IEEE PES Innovative Smart Grid Technologies Conference Europe, ISGT-Europe 2017 - Torino, Italy Duration: 26 Sept 2017 → 29 Sept 2017

Publication series

Name	IEEE PES Innovative Smart Grid Technologies Conference Europe
Publisher	IEEE
ISSN (Print)	2165-4816
ISSN (Electronic)	2165-4824

Conference

Conference	2017 IEEE PES Innovative Smart Grid Technologies Conference Europe, ISGT-Europe 2017
Country/Territory	Italy
City	Torino
Period	26/09/17 → 29/09/17

Bibliographical note

Publisher Copyright:
© 2017 IEEE.

Keywords

Aging failure modeling
Arrhenius relationship
Overhead conductors
Thermal stress
Weibull distribution

ASJC Scopus subject areas

Electrical and Electronic Engineering
Energy Engineering and Power Technology
Computer Networks and Communications

Access to Document

10.1109/ISGTEurope.2017.8260134Licence: None: All rights reserved

Vasquez_et_al_Advanced_aging_failure_model_for_overhead_conductors_ISGT-_Europe_2018
W. A. Vasquez, D. Jayaweera and J. Játiva-Ibarra, "Advanced aging failure model for overhead conductors," 2017 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT-Europe), Turin, Italy, 2017, pp. 1-6, doi: 10.1109/ISGTEurope.2017.8260134. © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Accepted author manuscript, 583 KBLicence: Other (please specify with Rights Statement)

https://ieeexplore.ieee.org/abstract/document/8260134Licence: None: All rights reserved

Cite this

Vasquez, W. A., Jayaweera, D., & Játiva-Ibarra, J. (2018). Advanced aging failure model for overhead conductors. In 2017 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT-Europe) Article 8260134 (IEEE PES Innovative Smart Grid Technologies Conference Europe). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ISGTEurope.2017.8260134

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title = "Advanced aging failure model for overhead conductors",

abstract = "Aging failure modeling is a fundamental requirement in reliability assessment of any actual power system. The level of model detail can potentially reflect realistic means of reliability indices. In that context, this paper proposes an advanced aging failure model for overhead conductors, incorporating the effects of loading and weather conditions into the unavailability calculation. The Arrhenius life-temperature relationship is used to model the lifetime of conductors as a function of temperature. The life measure of the Arrhenius model is adopted as the scale parameter of the Weibull probability distribution. The approach to estimate parameters of the resulting Arrhenius-Weibull distribution is described in detail. Unavailability calculations are performed using the proposed aging failure model for a distribution test system. The results show that if the maximum continuous operating temperature is exceeded, the unavailability of overhead conductors increases depending on both time period, where the conductor temperature is higher than the threshold, and conductor age.",

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Vasquez, WA, Jayaweera, D & Játiva-Ibarra, J 2018, Advanced aging failure model for overhead conductors. in 2017 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT-Europe)., 8260134, IEEE PES Innovative Smart Grid Technologies Conference Europe, Institute of Electrical and Electronics Engineers (IEEE), 2017 IEEE PES Innovative Smart Grid Technologies Conference Europe, ISGT-Europe 2017, Torino, Italy, 26/09/17. https://doi.org/10.1109/ISGTEurope.2017.8260134

Advanced aging failure model for overhead conductors. / Vasquez, Wilson A.; Jayaweera, Dilan; Játiva-Ibarra, Jesús.
2017 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT-Europe). Institute of Electrical and Electronics Engineers (IEEE), 2018. 8260134 (IEEE PES Innovative Smart Grid Technologies Conference Europe).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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N2 - Aging failure modeling is a fundamental requirement in reliability assessment of any actual power system. The level of model detail can potentially reflect realistic means of reliability indices. In that context, this paper proposes an advanced aging failure model for overhead conductors, incorporating the effects of loading and weather conditions into the unavailability calculation. The Arrhenius life-temperature relationship is used to model the lifetime of conductors as a function of temperature. The life measure of the Arrhenius model is adopted as the scale parameter of the Weibull probability distribution. The approach to estimate parameters of the resulting Arrhenius-Weibull distribution is described in detail. Unavailability calculations are performed using the proposed aging failure model for a distribution test system. The results show that if the maximum continuous operating temperature is exceeded, the unavailability of overhead conductors increases depending on both time period, where the conductor temperature is higher than the threshold, and conductor age.

AB - Aging failure modeling is a fundamental requirement in reliability assessment of any actual power system. The level of model detail can potentially reflect realistic means of reliability indices. In that context, this paper proposes an advanced aging failure model for overhead conductors, incorporating the effects of loading and weather conditions into the unavailability calculation. The Arrhenius life-temperature relationship is used to model the lifetime of conductors as a function of temperature. The life measure of the Arrhenius model is adopted as the scale parameter of the Weibull probability distribution. The approach to estimate parameters of the resulting Arrhenius-Weibull distribution is described in detail. Unavailability calculations are performed using the proposed aging failure model for a distribution test system. The results show that if the maximum continuous operating temperature is exceeded, the unavailability of overhead conductors increases depending on both time period, where the conductor temperature is higher than the threshold, and conductor age.

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Advanced aging failure model for overhead conductors

Abstract

Publication series

Conference

Bibliographical note

Keywords

ASJC Scopus subject areas

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