A threshold electron analyser for use in coincidence experiments

Paul A. Hatherly, M. Stankiewicz, K. Codling, Jeremy C. Creasey, H. M. Jones, Richard Tuckett

Research output: Contribution to journalArticlepeer-review

30 Citations (Scopus)

Abstract

A new design of threshold electron analyser is presented which takes
advantage of chromatic aberrations in electron lenses. Calculations show it to be
capable of both high resolution (-3.5 meV half-width) and high collection efficiency
(100% for zero energy electrons) even though a high extraction field (20Vcm.') is
used in order to extract ion fragments with equally high efficiency. It is therefore
particularly suitable for use in electron-ion coincidence experiments.
Representative results are shown for the photoionization of argon and oxygen by
vacuum ultraviolet radiation from the Daresbury synchrotron radiation source.
These demonstrate the potential of both the electron and ion analysers to be used
lor such coincidence experiments
Original languageEnglish
Pages (from-to)891-896
JournalMeasurement Science and Technology
Volume3
Issue number9
DOIs
Publication statusPublished - 1 Sep 1992

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