Abstract
Microcantilevers were machined from a single γ(TiAl)-α 2(Ti 3Al) lamellae colony of a polycrystalline commercial Ti-45Al-2Mn-2Nb sample using the focussed ion beam. The long axis of the microcantilevers is perpendicular to the lamellar interface with the notch prepared in the same γ lamella. Bending test results demonstrated good repeatability and the fracture stress intensity factor of individual γ lamella was measured to be 3.1 ± 0.2 MPa m 1/2. (Formula presented.) twinning ahead of the notch (crack) tip plays a key role in the crack initiation. TEM analysis shows that the interaction of twinning with the lamellar interface leads to interfacial cracking and contributes to the work-hardening observed.
| Original language | English |
|---|---|
| Pages (from-to) | 982-997 |
| Number of pages | 16 |
| Journal | Philosophical Magazine |
| Volume | 100 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 16 Jan 2020 |
Keywords
- Electron microscopy
- FIB
- Fracture
- Microcantilever
- γ-TiAl
ASJC Scopus subject areas
- Condensed Matter Physics
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