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Abstract
We present a practical approach to quantify the annular dark field (ADF) detector in scanning transmission electron microscope (STEM). The non-uniform response of the detector as a function of the beam current is investigated. The brightness and contrast of the preamplifier have been taken into account to find the black level of the detector. The efficiency map is obtained.
Original language | English |
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Article number | 012017 |
Journal | Journal of Physics: Conference Series |
Volume | 522 |
Issue number | 1 |
DOIs | |
Publication status | Published - 11 Jun 2014 |
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Dive into the research topics of 'A practical approach to quantify the ADF detector in STEM'. Together they form a unique fingerprint.Projects
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Towards an Atomic-scale understanding of the 3D Structures of size-selected Clusters on Surfaces
Li, Z. (Principal Investigator), Johnston, R. (Co-Investigator) & Palmer, R. (Co-Investigator)
Engineering & Physical Science Research Council
1/02/10 → 17/01/14
Project: Research Councils