A practical approach to quantify the ADF detector in STEM

D.S. He, Z.Y. Li

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)
142 Downloads (Pure)

Abstract

We present a practical approach to quantify the annular dark field (ADF) detector in scanning transmission electron microscope (STEM). The non-uniform response of the detector as a function of the beam current is investigated. The brightness and contrast of the preamplifier have been taken into account to find the black level of the detector. The efficiency map is obtained.
Original languageEnglish
Article number012017
JournalJournal of Physics: Conference Series
Volume522
Issue number1
DOIs
Publication statusPublished - 11 Jun 2014

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