A practical approach to quantify the ADF detector in STEM

D.S. He; Z.Y. Li

doi:10.1088/1742-6596/522/1/012017

A practical approach to quantify the ADF detector in STEM

D.S. He, Z.Y. Li

Physics and Astronomy

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Abstract

We present a practical approach to quantify the annular dark field (ADF) detector in scanning transmission electron microscope (STEM). The non-uniform response of the detector as a function of the beam current is investigated. The brightness and contrast of the preamplifier have been taken into account to find the black level of the detector. The efficiency map is obtained.

Original language	English
Article number	012017
Journal	Journal of Physics: Conference Series
Volume	522
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/522/1/012017
Publication status	Published - 11 Jun 2014

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Towards an Atomic-scale understanding of the 3D Structures of size-selected Clusters on Surfaces
Li, Z. (Principal Investigator), Johnston, R. (Co-Investigator) & Palmer, R. (Co-Investigator)
Engineering & Physical Science Research Council
1/02/10 → 17/01/14
Project: Research Councils

Cite this

@article{8627ce97246740d99669866dd5c1bd66,

title = "A practical approach to quantify the ADF detector in STEM",

abstract = "We present a practical approach to quantify the annular dark field (ADF) detector in scanning transmission electron microscope (STEM). The non-uniform response of the detector as a function of the beam current is investigated. The brightness and contrast of the preamplifier have been taken into account to find the black level of the detector. The efficiency map is obtained.",

author = "D.S. He and Z.Y. Li",

year = "2014",

month = jun,

day = "11",

doi = "10.1088/1742-6596/522/1/012017",

language = "English",

volume = "522",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP Publishing",

number = "1",

}

TY - JOUR

T1 - A practical approach to quantify the ADF detector in STEM

AU - He, D.S.

AU - Li, Z.Y.

PY - 2014/6/11

Y1 - 2014/6/11

N2 - We present a practical approach to quantify the annular dark field (ADF) detector in scanning transmission electron microscope (STEM). The non-uniform response of the detector as a function of the beam current is investigated. The brightness and contrast of the preamplifier have been taken into account to find the black level of the detector. The efficiency map is obtained.

AB - We present a practical approach to quantify the annular dark field (ADF) detector in scanning transmission electron microscope (STEM). The non-uniform response of the detector as a function of the beam current is investigated. The brightness and contrast of the preamplifier have been taken into account to find the black level of the detector. The efficiency map is obtained.

U2 - 10.1088/1742-6596/522/1/012017

DO - 10.1088/1742-6596/522/1/012017

M3 - Article

SN - 1742-6588

VL - 522

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

IS - 1

M1 - 012017

ER -

A practical approach to quantify the ADF detector in STEM

Abstract

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Towards an Atomic-scale understanding of the 3D Structures of size-selected Clusters on Surfaces

Cite this