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A near-field scanning microwave microscope for measurement of the permittivity and loss of high-loss materials
A. P. Gregory*, J. F. Blackburn, K. Lees, R. N. Clarke, T. E. Hodgetts, S. M. Hanham, N. Klein
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
8
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(Scopus)