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A dynamic model of the jump-to phenomenon during AFM analysis
J. Bowen, D. Cheneler
Chemical Engineering
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Article
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peer-review
5
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Engineering & Materials Science
Microscopes
91%
Dynamic models
76%
Soft materials
50%
Elastic moduli
31%
Van der Waals forces
28%
NEMS
27%
Colloids
27%
Substrates
26%
Elastohydrodynamic lubrication
25%
Interfacial energy
23%
Resonators
17%
Physical properties
16%
Mechanics
16%
Torque
13%
Mechanical properties
12%
Fluids
12%
Air
10%
Physics & Astronomy
dynamic models
100%
microscopes
72%
modulus of elasticity
30%
elastohydrodynamics
25%
Van der Waals forces
22%
lubrication
20%
compressing
19%
surface reactions
19%
colloids
18%
inertia
18%
surface energy
18%
torque
17%
physical properties
14%
resonators
14%
mechanical properties
12%
probes
11%
air
11%
fluids
11%
interactions
7%
simulation
7%
Chemistry
Force
64%
Inertia
27%
Surface
24%
Torque
23%
Mechanics
21%
Lubrication
21%
Van Der Waals Force
19%
Interfacial Energy
18%
Colloid
17%
Velocity
15%
Simulation
11%
Probe
11%
Length
11%