X-Ray Diffraction Studies of Residual Stress in New CoatingMaterials and Thin Films by Using Synchotron Radiation

  • Langford, John (Principal Investigator)

Project Details

Short titleX-Ray Diffraction Studies of Residual Stress in New CoatingMaterials and Thin Films by Using Synchotron Radiation
StatusFinished
Effective start/end date1/01/97 → 30/06/99

Funding

  • BRITISH COUNCIL
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